ᦦ Free (Anglais) ম Introduction To Mixed-Signal IC Test and Measurement Ҏ Kindle Ebook Author Mark Burns भ

ᦦ Free (Anglais) ম Introduction To Mixed-Signal IC Test and Measurement Ҏ Kindle Ebook Author Mark Burns भ Burns and Roberts have written an excellent book fulfilling the need for a good textbook on the subject of mixed signal test measurement Engineering Science Education, 2002Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry Mixed signal IC test and measurement has grown into a highly specialized field of electrical engineering It has become harder to hire and train new engineers to become skilled mixed signal test engineers The slow learning curve for mixed signal test engineers is largely due to the shortage of written materials and university level courses on the subject of mixed signal testing While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed signal automated test and measurement This book was written in response ot the shortage of basic course material for mixed signa test and measurement The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary This material is desinged to be useful as both a university textbook and as a reference manual for the beginning professional test engineer The prerequisite for this book is a junior level course in linear continuous time and discrete time systems, as well as exposure ot elementary probability and statistical concepts Chapter 1 presents an introduction to the context in which mixed singal testing is performed and why it is necessary Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code Test program structure and functionality are also discussed in Chapter 2 Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability In addition, basic data analysis is presented in Chapter 4 A thorough treatment of data analysis and statistical analysis is delayed until Chapter 15 Chapter 5 takes a closer look at the architecture of a generic mixed signal ATE tester The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality Chapter 6 presents an introduction to both ADC and DAC sampling theory DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed signal tester ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed signal tester Coherent multi tone sample sets are also introduced as an introduction to DSP based testing Chapter 7 further develops sampling theory concepts and DSP based testing methodologies, which are at the core of many mixed signal test and measurement techniques FFT fundamentals, windowing, frequency domain filtering, and other DSP based testing fundamentals are covered in Chapter 6 and 7 Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP based testing This chapter covers only non sampled channels, consisting of combinations of op amps, analog filters, PGAs and other continuous time circuits Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold S H amplifiers, etc Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters Testing of DACs is covered in Chapter 11 Several kinds of DACs are studied, including traditional binary weighted, resistive ladder, pulse with modulation PWM , and sigma delta architectures Traditional measurements like INL, DNL and absolute error are discussed Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested Again, several different kinds of ADC s are studied, including binary weighted, dual slope, flash, semi flash, and sigma delta architectures The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses Chapter 13 explores the gray art of mixed signal DIB design Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading Chapter 13 also illustrates several common DIB circuits and their use in mixed signal testing Chapter 14 gives a brief introduction to some of the techniques for analog and mixed signal design for test There are fewer structured approaches for mixed signal DfT than for purely digital DfT The common ad hoc methods are explained, as well as some of the industry standards such as IEEE Std 1149.1 and 1149.4 A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15 This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats Datalogs, shmoo plots, and histograms are discussed Also, statistical process control SPC is explained, including a discussion of process control metrics such as Cp and Cpk Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual head testing, multi site testing, and time to market A test engineer s debugging skills heavily impacts time to market Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixed signal test programs Finally, emerging trends that affect test economics and test development time are presented in Chapter 16 Some or all these trends will shape the future course of mixed siganl test and measurement. Introduction To Mixed-Signal IC Test and Measurement

  • 2.2
  • 1369
  • (Anglais)
  • 0195140168
  • Introduction To Mixed-Signal IC Test and Measurement

  • Mark Burns
  • Anglais
  • 07 July 2016

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